| Title |
Determination of precise crystallographic directions on Si{111} wafers using self-aligning pre-etched pattern
|
|---|---|
| Published in |
Micro and Nano Systems Letters, June 2018
|
| DOI | 10.1186/s40486-018-0066-1 |
| Authors |
Avvaru Venkata Narasimha Rao, Veerla Swarnalatha, Ashok Kumar Pandey, Prem Pal |
Mendeley readers
The data shown below were compiled from readership statistics for 24 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 24 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 7 | 29% |
| Student > Bachelor | 3 | 13% |
| Researcher | 3 | 13% |
| Student > Doctoral Student | 2 | 8% |
| Student > Master | 1 | 4% |
| Other | 3 | 13% |
| Unknown | 5 | 21% |
| Readers by discipline | Count | As % |
|---|---|---|
| Physics and Astronomy | 7 | 29% |
| Engineering | 5 | 21% |
| Chemical Engineering | 1 | 4% |
| Biochemistry, Genetics and Molecular Biology | 1 | 4% |
| Energy | 1 | 4% |
| Other | 3 | 13% |
| Unknown | 6 | 25% |