Defect Inspection Techniques in SiC

Overview of attention for article published in Nanoscale Research Letters, March 2022

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So far, Dimensions has found 6 publications that cite this research output.

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The most recent citing publications are shown below. View all 6 publications that cite this research output on Dimensions.

Novel Photonic Applications of Silicon Carbide

Article in Materials (January 2023)

3 SiC Single Crystal Semiconductors

Book chapter (January 2023)

Sympetalous defects in metalorganic vapor phase epitaxy (MOVPE)-grown homoepitaxial β-Ga2O3 films

Article in Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (January 2023)