| Title |
Defect Inspection Techniques in SiC
|
|---|---|
| Published in |
Discover Nano, March 2022
|
| DOI | 10.1186/s11671-022-03672-w |
| Pubmed ID | |
| Authors |
Po-Chih Chen, Wen-Chien Miao, Tanveer Ahmed, Yi-Yu Pan, Chun-Liang Lin, Shih-Chen Chen, Hao-Chung Kuo, Bing-Yue Tsui, Der-Hsien Lien |
Mendeley readers
The data shown below were compiled from readership statistics for 73 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 73 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 16 | 22% |
| Researcher | 12 | 16% |
| Student > Master | 4 | 5% |
| Other | 2 | 3% |
| Student > Doctoral Student | 2 | 3% |
| Other | 4 | 5% |
| Unknown | 33 | 45% |
| Readers by discipline | Count | As % |
|---|---|---|
| Materials Science | 16 | 22% |
| Engineering | 7 | 10% |
| Physics and Astronomy | 6 | 8% |
| Chemistry | 2 | 3% |
| Energy | 1 | 1% |
| Other | 1 | 1% |
| Unknown | 40 | 55% |