| Title |
Defect Inspection Techniques in SiC
|
|---|---|
| Published in |
Nanoscale Research Letters, March 2022
|
| DOI | 10.1186/s11671-022-03672-w |
| Pubmed ID | |
| Authors |
Po-Chih Chen, Wen-Chien Miao, Tanveer Ahmed, Yi-Yu Pan, Chun-Liang Lin, Shih-Chen Chen, Hao-Chung Kuo, Bing-Yue Tsui, Der-Hsien Lien |
Mendeley readers
The data shown below were compiled from readership statistics for 48 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 48 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 11 | 23% |
| Researcher | 9 | 19% |
| Student > Doctoral Student | 5 | 10% |
| Other | 2 | 4% |
| Student > Master | 2 | 4% |
| Other | 4 | 8% |
| Unknown | 15 | 31% |
| Readers by discipline | Count | As % |
|---|---|---|
| Materials Science | 17 | 35% |
| Physics and Astronomy | 4 | 8% |
| Engineering | 3 | 6% |
| Chemistry | 2 | 4% |
| Unspecified | 1 | 2% |
| Other | 0 | 0% |
| Unknown | 21 | 44% |