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Defect Inspection Techniques in SiC

Overview of attention for article published in Discover Nano, March 2022
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Citations

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Readers on

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77 Mendeley
Title
Defect Inspection Techniques in SiC
Published in
Discover Nano, March 2022
DOI 10.1186/s11671-022-03672-w
Pubmed ID
Authors

Po-Chih Chen, Wen-Chien Miao, Tanveer Ahmed, Yi-Yu Pan, Chun-Liang Lin, Shih-Chen Chen, Hao-Chung Kuo, Bing-Yue Tsui, Der-Hsien Lien

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 77 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 77 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 16 21%
Researcher 12 16%
Student > Master 4 5%
Unspecified 3 4%
Professor 2 3%
Other 7 9%
Unknown 33 43%
Readers by discipline Count As %
Materials Science 16 21%
Engineering 7 9%
Physics and Astronomy 6 8%
Unspecified 3 4%
Chemistry 2 3%
Other 2 3%
Unknown 41 53%