The data shown below were compiled from readership statistics for 85 Mendeley readers of this research output. Click here to see the associated Mendeley record.
| Title |
Defect Inspection Techniques in SiC
|
|---|---|
| Published in |
Discover Nano, March 2022
|
| DOI | 10.1186/s11671-022-03672-w |
| Pubmed ID | |
| Authors |
Po-Chih Chen, Wen-Chien Miao, Tanveer Ahmed, Yi-Yu Pan, Chun-Liang Lin, Shih-Chen Chen, Hao-Chung Kuo, Bing-Yue Tsui, Der-Hsien Lien |
Mendeley readers
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 85 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 17 | 20% |
| Researcher | 13 | 15% |
| Student > Master | 5 | 6% |
| Unspecified | 3 | 4% |
| Student > Bachelor | 2 | 2% |
| Other | 8 | 9% |
| Unknown | 37 | 44% |
| Readers by discipline | Count | As % |
|---|---|---|
| Materials Science | 17 | 20% |
| Physics and Astronomy | 8 | 9% |
| Engineering | 7 | 8% |
| Unspecified | 3 | 4% |
| Chemistry | 3 | 4% |
| Other | 2 | 2% |
| Unknown | 45 | 53% |