Depth-dependent EBIC microscopy of radial-junction Si micropillar arrays

Overview of attention for article published in Applied Microscopy, September 2020

Altmetric Badge

Mentioned by

twitter: 1 X user

Citations

dimensions_citation: 3 Dimensions

Readers on

mendeley: 3 Mendeley

Summary X Dimensions citations

So far, Altmetric has seen 1 X post from an account with 912 followers.

[2007.05620] Kaden M. Powell, Heayoung P. Yoon: Depth-Dependent EBIC Microscopy of Radial-Junction Si Micropillar Arrays https://t.co/LjpDDNmOg1 https://t.co/HkkfUAEDYb #cond_mat_mtrl_sci

Reply Repost Favourite