| Title |
Nanoelectronic COupled Problems Solutions: uncertainty quantification for analysis and optimization of an RFIC interference problem
|
|---|---|
| Published in |
Journal of Mathematics in Industry, November 2018
|
| DOI | 10.1186/s13362-018-0054-3 |
| Authors |
Piotr Putek, Rick Janssen, Jan Niehof, E. Jan W. ter Maten, Roland Pulch, Bratislav Tasić, Michael Günther |
Mendeley readers
The data shown below were compiled from readership statistics for 7 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 7 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Master | 2 | 29% |
| Professor > Associate Professor | 1 | 14% |
| Other | 1 | 14% |
| Researcher | 1 | 14% |
| Unknown | 2 | 29% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 2 | 29% |
| Biochemistry, Genetics and Molecular Biology | 1 | 14% |
| Social Sciences | 1 | 14% |
| Computer Science | 1 | 14% |
| Unknown | 2 | 29% |