| Title |
Hybrid importance sampling Monte Carlo approach for yield estimation in circuit design
|
|---|---|
| Published in |
Journal of Mathematics in Industry, October 2018
|
| DOI | 10.1186/s13362-018-0053-4 |
| Authors |
Anuj K. Tyagi, Xavier Jonsson, Theo G. J. Beelen, Wil H. A. Schilders |
Mendeley readers
The data shown below were compiled from readership statistics for 5 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 5 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Professor | 1 | 20% |
| Student > Ph. D. Student | 1 | 20% |
| Researcher | 1 | 20% |
| Unknown | 2 | 40% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 2 | 40% |
| Mathematics | 1 | 20% |
| Unknown | 2 | 40% |