Title |
A fast image simulation algorithm for scanning transmission electron microscopy
|
---|---|
Published in |
Advanced Structural and Chemical Imaging, May 2017
|
DOI | 10.1186/s40679-017-0046-1 |
Pubmed ID | |
Authors |
Colin Ophus |
Abstract |
Image simulation for scanning transmission electron microscopy at atomic resolution for samples with realistic dimensions can require very large computation times using existing simulation algorithms. We present a new algorithm named PRISM that combines features of the two most commonly used algorithms, namely the Bloch wave and multislice methods. PRISM uses a Fourier interpolation factor f that has typical values of 4-20 for atomic resolution simulations. We show that in many cases PRISM can provide a speedup that scales with f(4) compared to multislice simulations, with a negligible loss of accuracy. We demonstrate the usefulness of this method with large-scale scanning transmission electron microscopy image simulations of a crystalline nanoparticle on an amorphous carbon substrate. |
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