| Title |
Advanced atomic force microscopy-based techniques for nanoscale characterization of switching devices for emerging neuromorphic applications
|
|---|---|
| Published in |
Applied Microscopy, May 2021
|
| DOI | 10.1186/s42649-021-00056-9 |
| Pubmed ID | |
| Authors |
Young-Min Kim, Jihye Lee, Deok-Jin Jeon, Si-Eun Oh, Jong-Souk Yeo |
Mendeley readers
The data shown below were compiled from readership statistics for 27 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 27 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 5 | 19% |
| Student > Master | 4 | 15% |
| Other | 2 | 7% |
| Student > Bachelor | 2 | 7% |
| Researcher | 2 | 7% |
| Other | 2 | 7% |
| Unknown | 10 | 37% |
| Readers by discipline | Count | As % |
|---|---|---|
| Materials Science | 5 | 19% |
| Engineering | 3 | 11% |
| Environmental Science | 2 | 7% |
| Nursing and Health Professions | 1 | 4% |
| Economics, Econometrics and Finance | 1 | 4% |
| Other | 5 | 19% |
| Unknown | 10 | 37% |