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Nanoelectronic COupled problems solutions - nanoCOPS: modelling, multirate, model order reduction, uncertainty quantification, fast fault simulation

Overview of attention for article published in Journal of Mathematics in Industry, June 2016
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Title
Nanoelectronic COupled problems solutions - nanoCOPS: modelling, multirate, model order reduction, uncertainty quantification, fast fault simulation
Published in
Journal of Mathematics in Industry, June 2016
DOI 10.1186/s13362-016-0025-5
Authors

E Jan W ter Maten, Piotr A Putek, Michael Günther, Roland Pulch, Caren Tischendorf, Christian Strohm, Wim Schoenmaker, Peter Meuris, Bart De Smedt, Peter Benner, Lihong Feng, Nicodemus Banagaaya, Yao Yue, Rick Janssen, Jos J Dohmen, Bratislav Tasić, Frederik Deleu, Renaud Gillon, Aarnout Wieers, Hans-Georg Brachtendorf, Kai Bittner, Tomáš Kratochvíl, Jiří Petřzela, Roman Sotner, Tomáš Götthans, Jiří Dřínovský, Sebastian Schöps, David J Duque Guerra, Thorben Casper, Herbert De Gersem, Ulrich Römer, Pascal Reynier, Patrice Barroul, Denis Masliah, Benoît Rousseau

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 10 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 10 100%

Demographic breakdown

Readers by professional status Count As %
Other 2 20%
Lecturer 2 20%
Student > Doctoral Student 1 10%
Professor 1 10%
Student > Ph. D. Student 1 10%
Other 2 20%
Unknown 1 10%
Readers by discipline Count As %
Engineering 3 30%
Computer Science 2 20%
Mathematics 2 20%
Unknown 3 30%