Title |
Nanoelectronic COupled problems solutions - nanoCOPS: modelling, multirate, model order reduction, uncertainty quantification, fast fault simulation
|
---|---|
Published in |
Journal of Mathematics in Industry, June 2016
|
DOI | 10.1186/s13362-016-0025-5 |
Authors |
E Jan W ter Maten, Piotr A Putek, Michael Günther, Roland Pulch, Caren Tischendorf, Christian Strohm, Wim Schoenmaker, Peter Meuris, Bart De Smedt, Peter Benner, Lihong Feng, Nicodemus Banagaaya, Yao Yue, Rick Janssen, Jos J Dohmen, Bratislav Tasić, Frederik Deleu, Renaud Gillon, Aarnout Wieers, Hans-Georg Brachtendorf, Kai Bittner, Tomáš Kratochvíl, Jiří Petřzela, Roman Sotner, Tomáš Götthans, Jiří Dřínovský, Sebastian Schöps, David J Duque Guerra, Thorben Casper, Herbert De Gersem, Ulrich Römer, Pascal Reynier, Patrice Barroul, Denis Masliah, Benoît Rousseau |
Mendeley readers
The data shown below were compiled from readership statistics for 10 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 10 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Other | 2 | 20% |
Lecturer | 2 | 20% |
Student > Doctoral Student | 1 | 10% |
Professor | 1 | 10% |
Student > Ph. D. Student | 1 | 10% |
Other | 2 | 20% |
Unknown | 1 | 10% |
Readers by discipline | Count | As % |
---|---|---|
Engineering | 3 | 30% |
Computer Science | 2 | 20% |
Mathematics | 2 | 20% |
Unknown | 3 | 30% |