Optical excitation of atomic force microscopy cantilever for accurate spectroscopic measurements

Overview of attention for article published in EPJ Techniques and Instrumentation, February 2020

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RT @q9ac: 電磁場の放射圧で原子間力顕微鏡のカンチレバーを駆動、高精度化。 https://t.co/2EwuwzmTR0

電磁場の放射圧で原子間力顕微鏡のカンチレバーを駆動、高精度化。 https://t.co/2EwuwzmTR0

Optical excitation of atomic force microscopy cantilever for accurate spectroscopic measurements. https://t.co/8DEg7xLBpp