Enhanced resistive switching memory characteristics and mechanism using a Ti nanolayer at the W/TaOx interface

Overview of attention for article published in Discover Nano, June 2013

Altmetric Badge

Mentioned by

twitter: 1 X user

Citations

dimensions_citation: 4 Dimensions

Readers on

mendeley: 31 Mendeley

Summary X Dimensions citations

So far, Altmetric has seen 1 X post from an account with 162 followers.

Nanoscale Research Letters "RETRACTED ARTICLE: Enhanced resistive switching me..." https://t.co/4svJEXd1yn

Reply Repost Favourite