Investigation of charge carrier depletion in freestanding nanowires by a multi-probe scanning tunneling microscope

Overview of attention for article published in Nano Research, June 2018

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Multi-tip scanning tunneling microscopy

Cited by user Bert Voigtlaender on 11 Sep 2018

Multi-tip scanning tunneling microscopy (Multi-tip STM) extends scanning tunneling microscopy (STM) from imaging to dedicated electrical measurements at the nanoscale…