Recognizing Materials Using Perceptually Inspired Features

Overview of attention for article published in International Journal of Computer Vision, February 2013

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patent: 2 patents

Citations

dimensions_citation: 141 Dimensions

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mendeley: 121 Mendeley
citeulike: 1 CiteULike

Summary Patents Dimensions citations

So far, Altmetric has seen 2 patents that reference this research output.

Material-aware three-dimensional scanning

Grant US-10008024-B2

United States of America

Devices, systems, and methods for knowledge-based inference for material recognition

Grant US-9576203-B2

United States of America