RFID localization algorithms and applications—a review

Overview of attention for article published in Journal of Intelligent Manufacturing, August 2008

Altmetric Badge

About this Attention Score

Among the highest-scoring outputs from this source (#32 of 568)

Mentioned by

patent: 4 patents

Citations

dimensions_citation: 204 Dimensions

Readers on

mendeley: 182 Mendeley

Summary Patents Dimensions citations

So far, Altmetric has seen 4 patents that reference this research output.

Methods and apparatus for wideband localization

Grant US-10921419-B2

United States of America

Methods and apparatus for wideband localization

Grant US-10701662-B2

United States of America

Methods and apparatus for wideband localization

Grant US-10575277-B2

United States of America

Data driven composite location system using modeling and inference methods

Grant US-9507747-B2

United States of America