The overlay of lower envelopes and its applications

Overview of attention for article published in Discrete & Computational Geometry, January 1996

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In the top 25% of all research outputs scored by Altmetric
High Attention Score compared to outputs of the same age (84th percentile)

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Summary Patents Wikipedia

So far, Altmetric has seen 1 patent that references this research output.

Method for the automated identification of real world objects

Grant US-10776978-B2

United States of America