Throughput Analysis and Admission Control for IEEE 802.11a

Overview of attention for article published in Mobile Networks and Applications, October 2005

Altmetric Badge

Mentioned by

patent: 1 patent

Citations

dimensions_citation: 114 Dimensions

Readers on

mendeley: 40 Mendeley
citeulike: 1 CiteULike

Summary Patents Dimensions citations

So far, Altmetric has seen 1 patent that references this research output.

Priority-based admission control in a network with variable channel data rates

Grant US-7860002-B2

United States of America