XTraQue: traceability for product line systems

Overview of attention for article published in Software and Systems Modeling, September 2007

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Mentioned by

patent: 12 patents

Citations

dimensions_citation: 54 Dimensions

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mendeley: 71 Mendeley
citeulike: 2 CiteULike

Summary Patents Dimensions citations

So far, Altmetric has seen 12 patents that reference this research output.

Document analysis, commenting, and reporting system

Grant US-9535982-B2

United States of America

System for identifying textual relationships

Grant US-9400778-B2

United States of America

Document analysis, commenting, and reporting system

Grant US-9384187-B2

United States of America

Document analysis, commenting, and reporting system

Grant US-9183194-B2

United States of America

Analysis system for test artifact generation

Grant US-8935654-B2

United States of America

System for document analysis, commenting, and reporting with state machines

Grant US-8843819-B2

United States of America

System for requirement identification and analysis based on capability model structure

Grant US-8671101-B2

United States of America

Requirement statement manipulation system

Grant US-8566731-B2

United States of America

System for requirement identification and analysis based on capability mode structure

Grant US-8442985-B2

United States of America

Document analysis, commenting, and reporting system

Grant US-8412516-B2

United States of America

Document analysis, commenting, and reporting system

Grant US-8271870-B2

United States of America

Document analysis, commenting, and reporting system

Grant US-8266519-B2

United States of America