Improved Ni ohmic contact on n-type 4H-SiC

Overview of attention for article published in Journal of Electronic Materials, March 1997

Altmetric Badge

Mentioned by

patent: 1 patent

Readers on

mendeley: 18 Mendeley

Summary Patents

So far, Altmetric has seen 1 patent that references this research output.

Method for contacting a semiconductor configuration

Grant US-6815351-B2

United States of America