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An on-chip glitchy-clock generator for testing fault injection attacks
Overview of attention for article published in Journal of Cryptographic Engineering, October 2011
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About this Attention Score
Average Attention Score compared to outputs of the same age
Mentioned by
patent
1
patent
Citations
dimensions_citation
57
Dimensions
Readers on
mendeley
20
Mendeley
Summary
Patents
Dimensions citations
So far, Altmetric has seen
1
patent that references this research output.
SEMICONDUCTOR DEVICE
Application US-20160253524-A1
United States of America
01 Sep 2016