↓ Skip to main content
What is this page? Embed badge

On the unification of line processes, outlier rejection, and robust statistics with applications in early vision

Overview of attention for article published in International Journal of Computer Vision, July 1996
Altmetric Badge

About this Attention Score

  • In the top 25% of all research outputs scored by Altmetric
  • Good Attention Score compared to outputs of the same age (74th percentile)
  • Above-average Attention Score compared to outputs of the same age and source (62nd percentile)

Mentioned by

patent
5 patents
wikipedia
3 Wikipedia pages

Citations

dimensions_citation
554 Dimensions

Readers on

mendeley
203 Mendeley
citeulike
1 CiteULike
Summary Patents Wikipedia Dimensions citations
So far, Altmetric has seen 3 citations on 3 Wikipedia pages.

This page is provided by Altmetric.