↓ Skip to main content

I.C.E.: a transportable atomic inertial sensor for test in microgravity

Overview of attention for article published in Applied Physics B, August 2006
Altmetric Badge

About this Attention Score

  • In the top 25% of all research outputs scored by Altmetric
  • Good Attention Score compared to outputs of the same age (71st percentile)
  • Above-average Attention Score compared to outputs of the same age and source (57th percentile)

Mentioned by

patent
4 patents

Citations

dimensions_citation
45 Dimensions

Readers on

mendeley
49 Mendeley