SYSTEMS AND METHODS FOR SINGLE PARTICLE ANALYSIS Application WO-2020248757-A1 World Intellectual Property Organisation (WIPO) 17 Dec 2020
Electrospray ionization interface to high pressure mass spectrometry and related methods Grant US-10867781-B2 United States of America 15 Dec 2020
Ion supply system and method to control an ion supply system Grant US-10811243-B2 United States of America 20 Oct 2020
Electrospray ionization interface to high pressure mass spectrometry and related methods Grant US-10249484-B2 United States of America 02 Apr 2019
Method and apparatus for chemical ionization of a gas mixture Application US-10224190-B2 United States of America 05 Mar 2019
Instruments for measuring ion size distribution and concentration Grant US-9666423-B2 United States of America 30 May 2017
Electrospray ionization interface to high pressure mass spectrometry and related methods Grant US-9406492-B1 United States of America 02 Aug 2016
Radio frequency device to separate ions from gas stream and method thereof Application EP-2858089-A1 European Patent Office 08 Apr 2015
Electro-dynamic or electro-static lens coupled to a stacked ring ion guide Grant US-7915580-B2 United States of America 29 Mar 2011