Accelerated Light-Induced Degradation (ALID) for Monitoring of Defects in PV Silicon Wafers and Solar Cells

Overview of attention for article published in Journal of Electronic Materials, April 2010

Altmetric Badge

Mentioned by

patent: 1 patent

Citations

dimensions_citation: 17 Dimensions

Readers on

mendeley: 34 Mendeley

Summary Patents Dimensions citations

So far, Altmetric has seen 1 patent that references this research output.

Method of analyzing iron concentration of boron-doped p-type silicon wafer and method of…

Application EP-2423956-A3

European Patent Office