Support Vector Data Description

Overview of attention for article published in Machine Learning, January 2004

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In the top 25% of all research outputs scored by Altmetric
High Attention Score compared to outputs of the same age (96th percentile)
High Attention Score compared to outputs of the same age and source (85th percentile)

Mentioned by

patent: 24 patents

Citations

dimensions_citation: 2463 Dimensions

Readers on

mendeley: 538 Mendeley
citeulike: 3 CiteULike

So far, Altmetric has seen 24 patents that reference this research output.

Support Vector Data Description

About this Attention Score

Mentioned by

Citations

Readers on

Runtime adaptive risk assessment and automated mitigation

Grant US-11868479-B2

United States of America

状態判定装置及び状態判定方法

Grant JP-7343137-B2

Japan

Anomaly detection process

Application FR-3112634-A1

France

GENERATING NOISY COPIES OF TRAINING DATA IN A METHOD FOR DETECTING ANOMALIES

Application WO-2022013503-A1

World Intellectual Property Organisation (WIPO)

Closed-loop automatic defect inspection and classification

Grant US-10901402-B2

United States of America

STATE DETERMINING APPARATUS AND STATE DETERMINING METHOD

Application JP-2020160852-A

Japan

Managing anomaly detection models for fleets of industrial equipment

Grant US-10733813-B2

United States of America

Systems, methods, and media for generating sanitized data, sanitizing anomaly detection…

Application US-10178113-B2

United States of America

Closed-loop automatic defect inspection and classification

Grant US-10114368-B2

United States of America

Integration of automatic and manual defect classification

Grant US-10043264-B2

United States of America

Kernel parameter selection in support vector data description for outlier identification

Application US-9990592-B2

United States of America

Object detecting apparatus and method

Grant US-9934446-B2

United States of America

Fast training of support vector data description using sampling

Grant US-9830558-B1

United States of America

Sequential anomaly detection

Grant US-9727821-B2

United States of America

Optimization of unknown defect rejection for automatic defect classification

Grant US-9715723-B2

United States of America

Monitoring system based on a support vector data description

Grant US-9639809-B1

United States of America

Classifier readiness and maintenance in automatic defect classification

Grant US-9607233-B2

United States of America

Kernel parameter selection in support vector data description for outlier identification

Grant US-9536208-B1

United States of America

Hand-based biometric analysis

Grant US-9042606-B2

United States of America

Hand-based gender classification

Grant US-8655084-B2

United States of America

METHOD FOR CLASSIFYING DATA AND DEVICE FOR CLASSIFYING DATA

Application EP-2194463-A4

European Patent Office

Methods and systems to detect changes in multiple-frequency band sonar data

Grant US-8189428-B2

United States of America

METHOD FOR CLASSIFYING DATA AND DEVICE FOR CLASSIFYING DATA

Application EP-2194463-A1

European Patent Office

Methods and Systems to Detect Changes in Multiple-Frequency Band Sonar Data

Application US-20100046327-A1

United States of America