Testability analysis in high level data path synthesis

Overview of attention for article published in Journal of Electronic Testing, February 1993

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In the top 25% of all research outputs scored by Altmetric
One of the highest-scoring outputs from this source (#5 of 112)
High Attention Score compared to outputs of the same age (85th percentile)

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patent: 2 patents

Citations

dimensions_citation: 17 Dimensions

Summary Patents Dimensions citations

So far, Altmetric has seen 2 patents that reference this research output.

Partial-scan built-in self-testing circuit having improved testability

Grant US-5450414-A

United States of America

Partial-scan built-in selftesting sequential circuit

Application EP-0631235-A1

European Patent Office