SIMS of Organic Materials—Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions

Overview of attention for article published in Journal of the American Society for Mass Spectrometry, February 2018

Altmetric Badge

About this Attention Score

Average Attention Score compared to outputs of the same age
Above-average Attention Score compared to outputs of the same age and source (62nd percentile)

So far, Altmetric has seen 4 X posts from 4 X users, with an upper bound of 8,731 followers.

#JASMS SIMS of Organic Materials—Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions https://t.co/ikok71bylo #MassSpec https://t.co/mERTfCfPeP

RT @realBioMassSpec: SIMS of Organic Materials—Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions https:/…

RT @realBioMassSpec: SIMS of Organic Materials—Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions https:/…

SIMS of Organic Materials—Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions https://t.co/LETgjHyHsy