SOURCE-DETECTOR SYNCHRONIZATION IN MULTIPLEXED SECONDARY ION MASS SPECTROMETRY Application EP-4163637-A1 European Patent Office 12 Apr 2023
Miniature charged particle trap with elongated trapping region for mass spectrometry Grant US-11158496-B2 United States of America 26 Oct 2021
Ion traps with y-directional ion manipulation for mass spectrometry and related mass… Grant US-10937640-B2 United States of America 02 Mar 2021
SOURCE-DETECTOR SYNCHRONIZATION IN MULTIPLEXED SECONDARY ION MASS SPECTROMETRY Application WO-2019169125-A1 World Intellectual Property Organisation (WIPO) 06 Sep 2019
Ion traps with Y-directional ion manipulation for mass spectrometry and related mass… Grant US-10242857-B2 United States of America 26 Mar 2019
Miniature charged particle trap with elongated trapping region for mass spectrometry Grant US-10141178-B2 United States of America 27 Nov 2018
Miniature charged particle trap with elongated trapping region for mass spectrometry Grant US-9252005-B2 United States of America 02 Feb 2016
Miniature toroidal radio frequency ion trap mass analyzer Application US-9053919-B2 United States of America 09 Jun 2015
Miniature toroidal radio frequency ion trap mass analyzer Application US-20120267523-A1 United States of America 25 Oct 2012