François Hild, Qiwei Shi, Felix Latourte, Stéphane Roux. Backtracking depth-resolved microstructures for crystal plasticity identification – Part 1: Backtracking microstructures. JOM Journal of the Minerals, Metals and Materials Society, Springer Verlag (
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François Hild, Qiwei Shi, Felix Latourte, Stéphane Roux. Backtracking depth-resolved microstructures for crystal plasticity…