Computer-based systems, computer components and computer objects configured to implement… Grant JP-7399269-B2 Japan 15 Dec 2023
Integrated circuit margin measurement and failure prediction device Grant US-11841395-B2 United States of America 12 Dec 2023
Die-to-die connectivity monitoring using a clocked receiver Grant US-11815551-B1 United States of America 14 Nov 2023
Integrated circuit I/O integrity and degradation monitoring Grant US-11762789-B2 United States of America 19 Sep 2023
Integrated circuit degradation estimation and time-of-failure prediction using workload… Grant US-11740281-B2 United States of America 29 Aug 2023
Integrated circuit workload, temperature and/or subthreshold leakage sensor Grant US-11408932-B2 United States of America 09 Aug 2022
Integrated circuit margin measurement and failure prediction device Grant US-11385282-B2 United States of America 12 Jul 2022
Integrated circuit I/O integrity and degradation monitoring Grant US-11275700-B2 United States of America 15 Mar 2022
Efficient integrated circuit simulation and testing Grant US-11132485-B2 United States of America 28 Sep 2021
Integrated circuit I/O integrity and degradation monitoring Grant US-10740262-B2 United States of America 11 Aug 2020