Chinese Remaindering Based Cryptosystems in the Presence of Faults

Overview of attention for article published in Journal of Cryptology, October 1999

Altmetric Badge

Mentioned by

patent: 1 patent

Citations

dimensions_citation: 100 Dimensions

Readers on

mendeley: 46 Mendeley

Summary Patents Dimensions citations

So far, Altmetric has seen 1 patent that references this research output.

Countermeasure securing exponentiation based cryptography

Application EP-2154604-A1

European Patent Office