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On the formation of blisters in annealed hydrogenated a-Si layers

Overview of attention for article published in Nanoscale Research Letters, February 2013
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Title
On the formation of blisters in annealed hydrogenated a-Si layers
Published in
Nanoscale Research Letters, February 2013
DOI 10.1186/1556-276x-8-84
Pubmed ID
Authors

Miklós Serényi, Cesare Frigeri, Zsolt Szekrényes, Katalin Kamarás, Lucia Nasi, Attila Csik, Nguyen Quoc Khánh

Abstract

Differently hydrogenated radio frequency-sputtered a-Si layers have been studied by infrared (IR) spectroscopy as a function of the annealing time at 350°C with the aim to get a deeper understanding of the origin of blisters previously observed by us in a-Si/a-Ge multilayers prepared under the same conditions as the ones applied to the present a-Si layers. The H content varied between 10.8 and 17.6 at.% as measured by elastic recoil detection analysis. IR spectroscopy showed that the concentration of the clustered (Si-H)n groups and of the (Si-H2)n (n ≥ 1) polymers increased at the expense of the Si-H mono-hydrides with increasing annealing time, suggesting that there is a corresponding increase of the volume of micro-voids whose walls are assumed from literature to be decorated by the clustered mono-hydride groups and polymers. At the same time, an increase in the size of surface blisters was observed. Also, with increasing annealing time, the total concentration of bonded H of any type decreases, indicating that H is partially released from its bonds to Si. It is argued that the H released from the (Si-H)n complexes and polymers at the microvoid surfaces form molecular H2 inside the voids, whose size increases upon annealing because of the thermal expansion of the H2 gas, eventually producing plastic surface deformation in the shape of blisters.

Mendeley readers

The data shown below were compiled from readership statistics for 15 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 15 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 9 60%
Student > Master 2 13%
Researcher 2 13%
Student > Bachelor 1 7%
Unknown 1 7%
Readers by discipline Count As %
Engineering 5 33%
Physics and Astronomy 4 27%
Materials Science 3 20%
Chemical Engineering 1 7%
Unknown 2 13%

Attention Score in Context

This research output has an Altmetric Attention Score of 1. This is our high-level measure of the quality and quantity of online attention that it has received. This Attention Score, as well as the ranking and number of research outputs shown below, was calculated when the research output was last mentioned on 15 February 2013.
All research outputs
#20,182,546
of 22,696,971 outputs
Outputs from Nanoscale Research Letters
#724
of 1,074 outputs
Outputs of similar age
#271,411
of 307,673 outputs
Outputs of similar age from Nanoscale Research Letters
#20
of 87 outputs
Altmetric has tracked 22,696,971 research outputs across all sources so far. This one is in the 1st percentile – i.e., 1% of other outputs scored the same or lower than it.
So far Altmetric has tracked 1,074 research outputs from this source. They receive a mean Attention Score of 3.2. This one is in the 1st percentile – i.e., 1% of its peers scored the same or lower than it.
Older research outputs will score higher simply because they've had more time to accumulate mentions. To account for age we can compare this Altmetric Attention Score to the 307,673 tracked outputs that were published within six weeks on either side of this one in any source. This one is in the 1st percentile – i.e., 1% of its contemporaries scored the same or lower than it.
We're also able to compare this research output to 87 others from the same source and published within six weeks on either side of this one. This one is in the 1st percentile – i.e., 1% of its contemporaries scored the same or lower than it.