Analysis of crystal defects by scanning transmission electron microscopy (STEM) in a modern scanning electron microscope

Overview of attention for article published in Advanced Structural and Chemical Imaging, March 2019

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In the top 25% of all research outputs scored by Altmetric
High Attention Score compared to outputs of the same age (85th percentile)

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So far, Altmetric has seen 2 news stories from 2 outlets.

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